♪ Electricity ♪
Today we're demonstrating the best-in-class Common-Mode Transient immunity
of NVE IL700-Series Isolators.
I'm Steve Schablitsky, a high-voltage test engineer at NVE Corporation.
The test voltage transient is shown on the top oscilloscope trace.
A 12 megahertz signal is sent into the isolator from the common-mode side,
and routed to the grounded side using the bottom trace.
A positive 200 kilovolt per microsecond transient is applied,
and several asynchronous captures are made.
The output remains stable.
Only by increasing the transient to 230 kilovolts per microsecond
do changes in output state appear.
This is well above the part's 100 kilovolt per microsecond minimum CMTI specification.
The test is repeated for negative transients.
Again, the output remains stable at 200 kilovolts per microsecond.
This is a simplified schematic of our test circuit:
The circuit creates a rising slope transient.
A similar circuit can be used for the falling transient.
When the MOSFET turns on ,
the transistor source charges to a high potential,
creating voltage transient with a known slope.
CMTI tests can be either static, where the inputs are tied to either logic HIGH or LOW;
or dynamic, where the input signal is a pulse stream.
We re demonstrating dynamic, since it s a real-world test.
NVE offers a full line of channel configurations in the IL700 / IL200 Isolator product family,
all with best-in-class features, including:
best-in-class common-mode transient immunity,
best-in-class isolation voltage,
best-in-class barrier life,
and the smallest packages in the industry,
including MSOP-8s.
Here are links to more information: